author = {Kaczer, Ben and Franco, J. and Weckx, P. and Roussel, Ph. J. and Simicic, Marko and Putcha, Vamsi and Bury, E. and Cho, M. and Degraeve, R. and Linten, D and Groeseneken, G. and Debacker, Peter and Parvais, Bertrand and Raghavan, P. and Catthoor, F. and Rzepa, Gerhard and Waltl, Michael and G{\"o}s, Wolfgang and Grasser, Tibor},
    title = {{T}he {D}efect-{C}entric {P}erspective of {D}evice and {C}ircuit {R}eliability - {F}rom {G}ate {O}xide {D}efects to {C}ircuits},
    journal = {{S}olid-{S}tate {E}lectronics},
    year = {2016},
    volume = {125},
    pages = {52--62},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Rzepa_1.pdf},
    doi = {10.1016/j.sse.2016.07.010}

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