author = {Kaczer, Ben and Franco, J. and Tyaginov, S. E. and Jech, Markus and Rzepa, Gerhard and Grasser, Tibor and O'Sullivan, Barry J. and Ritzenhaler, Romain and Schram, Tom and Spessot, Alessio and Linten, D and Horiguchi, N.},
    title = {Mapping of CMOS FET Degradation in Bias Space--Application to Dram Peripheral Devices},
    journal = {Journal of Vacuum Science {\&} Technology B},
    year = {2017},
    volume = {35},
    number = {1},
    pages = {01A109-1--01A109-6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/JB2017_Tyaginov_1.pdf},
    doi = {10.1116/1.4972872}

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