[Zurück]

@inproceedings{TUW-260022,
    author = {Ullmann, Bianka and Jech, Markus and Tyaginov, S. E. and Waltl, Michael and Illarionov, Yury and Grill, Alexander and Puschkarsky, Katja and Reisinger, H. and Grasser, Tibor},
    title = {The Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on Single Oxide Defects},
    booktitle = {2017 IEEE International Reliability Physics Symposium (IRPS)},
    year = {2017},
    pages = {XT-10.1--XT-10.6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Ullmann_1.pdf},
    isbn = {978-1-5090-6642-1},
    doi = {10.1109/IRPS.2017.7936424},
    note = {Posterpr{\"a}sentation: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 2017-04-04 -- 2017-04-06}
}



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