[Zurück]

@inproceedings{TUW-260317,
    author = {Illarionov, Yury and Waltl, Michael and Jech, Markus and Kim, J.-S. and Akinwande, D. and Grasser, Tibor},
    title = {Reliability of Black Phosphorus Field-Effect Transistors with Respect to Bias-Temperature and Hot-Carrier Stress},
    booktitle = {2017 IEEE International Reliability Physics Symposium (IRPS)},
    year = {2017},
    pages = {6A-6.1--6A-6.6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Illarionov_2.pdf},
    isbn = {978-1-5090-6642-1},
    doi = {10.1109/IRPS.2017.7936338},
    note = {Vortrag: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 2017-04-02 -- 2017-04-06}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.