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@inproceedings{TUW-260317,
    author = {Illarionov, Yury and Waltl, Michael and Jech, Markus and Kim, J.-S. and Akinwande, D. and Grasser, Tibor},
    title = {{R}eliability of {B}lack {P}hosphorus {F}ield-{E}ffect {T}ransistors with {R}espect to {B}ias-{T}emperature and {H}ot-{C}arrier {S}tress},
    booktitle = {2017 {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S})},
    year = {2017},
    pages = {6A-6.1--6A-6.6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Illarionov_2.pdf},
    isbn = {978-1-5090-6642-1},
    doi = {10.1109/IRPS.2017.7936338},
    note = {talk: {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S}), {M}onterey, {C}{A}, {U}{S}{A}; 2017-04-02 -- 2017-04-06}
}



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