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@inproceedings{TUW-260342,
    author = {Chasin, A and Franco, J. and Kaczer, Ben and Putcha, Vamsi and Weckx, P. and Ritzenthaler, Romain and Mertens, H. and Horiguchi, N. and Linten, D and Rzepa, Gerhard},
    title = {{B}{T}{I} {R}eliability and {T}ime-{D}ependent {V}ariability of {S}tacked {G}ate-{A}ll-{A}round {S}i {N}anowire {T}ransistors},
    booktitle = {{P}roceedings of the {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S})},
    year = {2017},
    pages = {5C-4.1--5C-4.7},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Rzepa_02.pdf},
    isbn = {978-1-5090-6641-4},
    note = {poster presentation: {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S}), {M}onterey, {C}{A}, {U}{S}{A}; 2017-04-02 -- 2017-04-06}
}



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