[Zurück]

@inproceedings{TUW-260344,
    author = {Rzepa, Gerhard and Franco, J. and Subirats, A and Jech, Markus and Chasin, A and Grill, Alexander and Waltl, Michael and Knobloch, Theresia and Stampfer, Bernhard and Chiarella, T. and Horiguchi, N. and Ragnarsson, L. A. and Linten, D and Kaczer, Ben and Grasser, Tibor},
    title = {Efficient Physical Defect Model Applied to PBTI in High-{\&}{\#}954; Stacks},
    booktitle = {Proceedings of IRPS 2017},
    year = {2017},
    pages = {XT-11.1--XT-11.6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Rzepa_04.pdf},
    isbn = {978-1-5090-6641-4},
    note = {Posterpr{\"a}sentation: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 2017-04-02 -- 2017-04-06}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.