author = {Kaczer, Ben and Franco, J. and Weckx, P. and Roussel, Ph. J. and Putcha, Vamsi and Bury, E. and Simicic, Marko and Chasin, A and Linten, D and Parvais, Bertrand and Catthoor, F. and Rzepa, Gerhard and Waltl, Michael and Grasser, Tibor},
    title = {{A} {B}rief {O}verview of {G}ate {O}xide {D}efect {P}roperties and {T}heir {R}elation to {M}{O}{S}{F}{E}{T} {I}nstabilities and {D}evice and {C}ircuit {T}ime-{D}ependent {V}ariability},
    journal = {{M}icroelectronics {R}eliability},
    year = {2018},
    volume = {81},
    pages = {186--194},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Rzepa_1.pdf},
    doi = {10.1016/j.microrel.2017.11.022},
    note = {invited}

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