author = {Tyaginov, S. E. and Makarov, Alexander and Jech, Markus and Vexler, M. I. and Franco, J. and Kaczer, Ben and Grasser, Tibor},
    title = {Physical Principles of Self-Consistent Simulation of the Generation of Interface States and the Transport of Hot Charge Carriers in Field-Effect Transistors Based on Metal-Oxide-Semiconductor Structures},
    journal = {Semiconductors (Physics of Semiconductor Devices)},
    year = {2018},
    volume = {52},
    number = {2},
    pages = {242--247},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Tyaginov_1.pdf},
    doi = {10.1134/S1063782618020203}

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.