author = {Tyaginov, S. E. and Makarov, Alexander and Jech, Markus and Vexler, M. I. and Franco, J. and Kaczer, Ben and Grasser, Tibor},
    title = {{P}hysical {P}rinciples of {S}elf-{C}onsistent {S}imulation of the {G}eneration of {I}nterface {S}tates and the {T}ransport of {H}ot {C}harge {C}arriers in {F}ield-{E}ffect {T}ransistors {B}ased on {M}etal-{O}xide-{S}emiconductor {S}tructures},
    journal = {{S}emiconductors ({P}hysics of {S}emiconductor {D}evices)},
    year = {2018},
    volume = {52},
    number = {2},
    pages = {242--247},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Tyaginov_1.pdf},
    doi = {10.1134/S1063782618020203}

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