[Zurück]

@inproceedings{TUW-269990,
    author = {Makarov, Alexander and Tyaginov, S. E. and Kaczer, Ben and Jech, Markus and Chasin, A and Grill, Alexander and Hellings, Geert and Vexler, M.I. and Linten, D and Grasser, Tibor},
    title = {Hot-Carrier Degradation in FinFETs: Modeling, Peculiarities, and Impact of Device Topology},
    booktitle = {Proceedings of the 2017 International Electron Devices Meeting (IEDM) Technical Digest},
    year = {2017},
    pages = {310--313},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2017_Makarov_1.pdf},
    isbn = {978-1-5386-3559-9},
    doi = {10.1109/IEDM.2017.8268381},
    note = {Vortrag: International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 2017-12-02 -- 2017-12-06}
}



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