[Zurück]

@inproceedings{TUW-269993,
    author = {Tyaginov, S. E. and Makarov, Alexander and Jech, Markus and Franco, J. and Sharma, Prateek and Kaczer, Ben and Grasser, Tibor},
    title = {On the Effect of Interface Traps on the Carrier Distribution Function During Hot-Carrier Degradation},
    booktitle = {Proceedings of the 2016 IEEE International Integrated Reliability Workshop Final Report (IIRW)},
    year = {2016},
    pages = {95--98},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2016_Makarov_3.pdf},
    isbn = {978-1-5090-4193-0},
    doi = {10.1109/IIRW.2016.7904911},
    note = {Posterpr{\"a}sentation: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 2016-10-09 -- 2016-10-13}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.