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@inproceedings{TUW-269995,
    author = {Illarionov, Yury and Molina- Mendoza, Aday J. and Waltl, Michael and Knobloch, Theresia and Furchi, Marco Mercurio and Mueller, T. and Grasser, Tibor},
    title = {{R}eliability of next-generation field-effect transistors with transition metal dichalcogenides},
    booktitle = {{P}roceedings of the 2018 {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S})},
    year = {2018},
    numpages = {6},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2018_Illarionov_1.pdf},
    isbn = {978-1-5386-5479-8},
    doi = {10.1109/IRPS.2018.8353605},
    note = {talk: {I}{E}{E}{E} {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S}), {B}urlingame, {C}{A}, {U}{S}{A}; 2018-03-11 -- 2018-03-15}
}



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