[Zurück]

@article{TUW-271991,
    author = {Makarov, Alexander and Tyaginov, S. E. and Kaczer, Ben and Jech, Markus and Chasin, A and Grill, Alexander and Hellings, Geert and Vexler, M. I. and Linten, D and Grasser, Tibor},
    title = {Analysis of the Features of Hot-Carrier Degradation in FinFETs},
    journal = {Semiconductors (Physics of Semiconductor Devices)},
    year = {2018},
    volume = {52},
    number = {10},
    pages = {1177--1182},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Makarov_1.pdf},
    doi = {10.1134/S1063782618100081}
}



Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.