[Zurück]

@inproceedings{TUW-275344,
    author = {Grasser, Tibor and Stampfer, Bernhard and Waltl, Michael and Rzepa, Gerhard and Rupp, Karl and Schanovsky, Franz and Pobegen, G. and Puschkarsky, Katja and Reisinger, H. and O'Sullivan, B. J. and Kaczer, Ben},
    title = {Characterization and Physical Modeling of the Temporal Evolution of Near-Interfacial States Resulting from NBTI/PBTI Stress in nMOS/pMOS Transistors},
    booktitle = {Proceedings of the 2018 IEEE International Reliability Physics Symposium (IRPS)},
    year = {2018},
    pages = {2A.2-1--2A.2-10},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2018_Grasser_03.pdf},
    note = {Vortrag: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; 2018-03-11 -- 2018-03-15}
}



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