author = {Ullmann, Bianka and Jech, Markus and Puschkarsky, Katja and Rott, Gunnar Andreas and Waltl, Michael and Illarionov, Yury and Reisinger, H. and Grasser, Tibor},
    title = {Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part I: Experimental},
    journal = {IEEE Transactions on Electron Devices},
    year = {2019},
    volume = {66},
    number = {1},
    pages = {232--240},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Ullmann_1.pdf},
    doi = {10.1109/TED.2018.2873419}

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.