author = {Jech, Markus and Ullmann, Bianka and Rzepa, Gerhard and Tyaginov, S. E. and Grill, Alexander and Waltl, Michael and Jabs, Dominic and Jungemann, C. and Grasser, Tibor},
    title = {Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory},
    journal = {IEEE Transactions on Electron Devices},
    year = {2019},
    volume = {66},
    number = {1},
    pages = {241--248},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Jech_1.pdf},
    doi = {10.1109/TED.2018.2873421}

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