author = {G{\"o}s, Wolfgang and Wimmer, Yannick and El-Sayed, Al-Moatasem and Rzepa, Gerhard and Jech, Markus and Shluger, A. L. and Grasser, Tibor},
    title = {Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence},
    journal = {Microelectronics Reliability},
    year = {2018},
    volume = {87},
    pages = {286--320},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Goes_1.pdf},
    doi = {10.1016/j.microrel.2017.12.021}

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.