author = {G{\"o}s, Wolfgang and Wimmer, Yannick and El-Sayed, Al-Moatasem and Rzepa, Gerhard and Jech, Markus and Shluger, A. L. and Grasser, Tibor},
    title = {{I}dentification of oxide defects in semiconductor devices: {A} systematic approach linking {D}{F}{T} to rate equations and experimental evidence},
    journal = {{M}icroelectronics {R}eliability},
    year = {2018},
    volume = {87},
    pages = {286--320},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Goes_1.pdf},
    doi = {10.1016/j.microrel.2017.12.021}

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