@article{TUW-277392,
author = {G{\"o}s, Wolfgang and Wimmer, Yannick and El-Sayed, Al-Moatasem and Rzepa, Gerhard and Jech, Markus and Shluger, A. L. and Grasser, Tibor},
title = {{I}dentification of {O}xide {D}efects in {S}emiconductor {D}evices: {A} {S}ystematic {A}pproach {L}inking {D}{F}{T} to {R}ate {E}quations and {E}xperimental {E}vidence},
journal = {{M}icroelectronics {R}eliability},
year = {2018},
volume = {87},
pages = {286--320},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Goes_1.pdf},
doi = {10.1016/j.microrel.2017.12.021}
}
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