[Zurück]

@article{TUW-278768,
    author = {Tyaginov, S. E. and Makarov, Alexander and Kaczer, Ben and Jech, Markus and Chasin, A and Grill, Alexander and Hellings, Geert and Vexler, M. I. and Linten, D and Grasser, Tibor},
    title = {Impact of the Device Geometric Parameters on Hot-Carrier Degradation in FinFETs},
    journal = {Semiconductors (Physics of Semiconductor Devices)},
    year = {2018},
    volume = {52},
    number = {13},
    pages = {1738--1742},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Tyaginov_2.pdf},
    doi = {10.1134/S1063782618130183}
}



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