author = {Illarionov, Yury and Banshchikov, A. G. and Polyushkin, Dmitry K. and Wachter, Stefan and Knobloch, Theresia and Thesberg, Michael and Vexler, M. I. and Lanza, Mario and Sokolov, N. S. and M{\"u}ller, Alexander and Grasser, Tibor},
    title = {{R}eliability of {S}calable {M}o{S}2 {F}{E}{T}s {W}ith 2 nm {C}rystalline {C}a{F}2 {I}nsulators},
    journal = {2{D} {M}aterials},
    year = {2019},
    volume = {6},
    number = {4},
    pages = {045004},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2019_Illarionov_2.pdf},
    doi = {10.1088/2053-1583/ab28f2}

Created from the Publication Database of the Vienna University of Technology.