author = {Illarionov, Yury and Banshchikov, A. G. and Polyushkin, Dmitry K. and Wachter, Stefan and Knobloch, Theresia and Thesberg, Michael and Vexler, M. I. and Waltl, Michael and Lanza, Mario and Sokolov, N. S. and M{\"u}ller, Alexander and Grasser, Tibor},
    title = {{R}eliability of {S}calable {M}o{S}2 {F}{E}{T}s {W}ith 2 nm {C}rystalline {C}a{F}2 {I}nsulators},
    journal = {2{D} {M}aterials},
    year = {2019},
    volume = {6},
    number = {4},
    pages = {045004},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2019_Illarionov_2.pdf},
    doi = {10.1088/2053-1583/ab28f2}

Created from the Publication Database of the Vienna University of Technology.