@article{TUW-282840,
author = {Ceric, Hajdin and Zahedmanesh, Houman and Croes, Kristof},
title = {{A}nalysis of {E}lectromigration {F}ailure of {N}ano-{I}nterconnects through a {C}ombination of {M}odeling and {E}xperimental {M}ethods},
journal = {{M}icroelectronics {R}eliability},
year = {2019},
volume = {100-101},
pages = {113362},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2019_Ceric_1.pdf},
doi = {10.1016/j.microrel.2019.06.054}
}
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