author = {Franco, J. and Wu, Zhicheng and Rzepa, Gerhard and Vandooren, Anne and Arimura, H and Ragnarsson, L. A. and Hellings, Geert and Brus, Stephan and Cott, D. and De Heyn, Vincent and Groeseneken, G. and Horiguchi, N. and Ryckaert, J. and Collaert, N. and Linten, D and Grasser, Tibor and Kaczer, Ben},
    title = {{B}{T}{I} {R}eliability {I}mprovement {S}trategies in {L}ow {T}hermal {B}udget {G}ate {S}tacks for 3{D} {S}equential {I}ntegration},
    booktitle = {{P}roceedings of the {I}nternational {E}lectron {D}evices {M}eeting ({I}{E}{D}{M})},
    year = {2018},
    pages = {34.2.1--34.2.4},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2018_Franco_3.pdf},
    isbn = {978-1-7281-1987-8},
    doi = {10.1109/IEDM.2018.8614559},
    note = {talk: {I}nternational {E}lectron {D}evices {M}eeting ({I}{E}{D}{M}), {S}an {F}rancisco, {U}{S}{A}; 2018-12-01 -- 2018-12-05}

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