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@inproceedings{TUW-287982,
    author = {Shah, Ambika and Waltl, Michael},
    title = {{L}ow {C}ost and {H}igh {P}erformance {R}adiation {H}ardened {L}atch {D}esign for {R}eliable {C}ircuits},
    booktitle = {{P}roceedings of the {I}{E}{E}{E} {I}nternational {C}onference on {E}lectronics {C}ircuits and {S}ystems ({I}{C}{E}{C}{S})},
    year = {2019},
    pages = {197--200},
    url = {https://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Shah_1.pdf},
    doi = {10.1109/ICECS46596.2019.8964962},
    note = {talk: {I}{E}{E}{E} {I}nternational {C}onference on {E}lectronics {C}ircuits and {S}ystems ({I}{C}{E}{C}{S}), {G}enova, {I}taly; 2019-11-27 -- 2019-11-29}
}



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