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@inproceedings{TUW-288499,
    author = {Waltl, Michael},
    title = {{C}haracterization and {M}odeling of {S}ingle {C}harge {T}rapping in {M}{O}{S} {T}ransistors},
    booktitle = {{P}roceedings of the {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop ({I}{I}{R}{W})},
    year = {2019},
    pages = {1--9},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Waltl_1.pdf},
    doi = {10.1109/IIRW47491.2019.8989880},
    note = {invited; talk: {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop ({I}{I}{R}{W}), {S}outh {L}ake {T}ahoe, {C}{A}, {U}{S}{A}; 2019-10-13 -- 2019-10-17}
}



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