@article{TUW-288537,
author = {Shah, Ambika and Rossi, Daniele and Sharma, Vishal and Vishvakarma, Santosh Kumar and Waltl, Michael},
title = {{S}oft {E}rror {H}ardening {E}nhancement {A}nalysis of {N}{B}{T}{I} {T}olerant {S}chmitt {T}rigger {C}ircuit},
journal = {{M}icroelectronics {R}eliability},
year = {2020},
volume = {107},
pages = {113617},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Shah_4.pdf},
doi = {10.1016/j.microrel.2020.113617}
}
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