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@incollection{TUW-289358,
    author = {Stampfer, Bernhard and Grill, Alexander and Waltl, Michael},
    title = {{A}dvanced {E}lectrical {C}haracterization of {S}ingle {O}xide {D}efects {U}tilizing {N}oise {S}ignals},
    booktitle = {{N}oise in {N}anoscale {S}emiconductor {D}evices},
    year = {2020},
    editor = {Grasser, Tibor},
    pages = {229--257},
    publisher = {{S}pringer {I}nternational {P}ublishing},
    url = {https://www.iue.tuwien.ac.at/pdf/ib_2020/BC2020_Stampfer_1.pdf},
    isbn = {978-3-030-37499-0},
    doi = {10.1007/978-3-030-37500-3{\_}7}
}



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