@incollection{TUW-289359,
author = {Waldh{\"o}r, Dominic and El-Sayed, Al-Moatasem and Wimmer, Yannick and Waltl, Michael and Grasser, Tibor},
title = {{A}tomistic {M}odeling of {O}xide {D}efects},
booktitle = {{N}oise in {N}anoscale {S}emiconductor {D}evices},
year = {2020},
editor = {Grasser, Tibor},
pages = {609--648},
publisher = {{S}pringer {I}nternational {P}ublishing},
url = {https://www.iue.tuwien.ac.at/pdf/ib_2020/BC2020_Waldhoer_1.pdf},
isbn = {978-3-030-37499-0},
doi = {10.1007/978-3-030-37500-3{\_}18}
}
Created from the Publication Database of the Vienna University of Technology.