author = {Jech, Markus and Rott, Gunnar Andreas and Reisinger, H. and Tyaginov, S. E. and Rzepa, Gerhard and Grill, Alexander and Jabs, Dominic and Jungemann, C. and Waltl, Michael and Grasser, Tibor},
    title = {{Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {\{}V{$_{G}$}, V{$_{D}$}{\}} Bias Space: Implications and Peculiarities}},
    journal = {{I}{E}{E}{E} {T}ransactions on {E}lectron {D}evices},
    year = {2020},
    volume = {67},
    number = {8},
    pages = {3315--3322},
    url = {https://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Jech_1.pdf},
    doi = {10.1109/TED.2020.3000749}

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