@inproceedings{TUW-295135,
author = {Tselios, Konstantinos and Stampfer, Bernhard and Michl, Jakob and Ioannidis, Eleftherios and Enichlmair, H. and Waltl, Michael},
title = {{D}istribution of {S}tep {H}eights of {E}lectron and {H}ole {T}raps in {S}i{O}{N} n{M}{O}{S} {T}ransistors},
booktitle = {{P}roceedings of the {I}nternational {I}ntegrated {R}eliability {W}orkshop ({I}{I}{R}{W})},
year = {2020},
pages = {1--6},
url = {http://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Tselios_1.pdf},
doi = {10.1109/IIRW49815.2020.9312871},
note = {talk: {I}{E}{E}{E} {I}nternational {I}ntegrated {R}eliability {W}orkshop ({I}{I}{R}{W}), {S}outh {L}ake {T}ahoe, {C}{A}, {U}{S}{A} - virtual; 2020-10-04 -- 2020-10-08}
}
Created from the Publication Database of the Vienna University of Technology.