author = {Waltl, Michael and Waldh{\"o}r, Dominic and Tselios, Konstantinos and Stampfer, Bernhard and Schleich, Christian and Rzepa, Gerhard and Enichlmair, H. and Ioannidis, Eleftherios and Minixhofer, R. and Grasser, Tibor},
    title = {{I}mpact of {S}ingle-{D}efects on the {V}ariability of {C}{M}{O}{S} {I}nverter {C}ircuits},
    journal = {{M}icroelectronics {R}eliability},
    year = {2021},
    volume = {126},
    pages = {114275-1--114275-6},
    url = {https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Waltl_4.pdf},
    doi = {10.1016/j.microrel.2021.114275}

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