author = {Wilhelmer, Christoph and Waldh{\"o}r, Dominic and Jech, Markus and El-Sayed, Al-Moatasem and Cvitkovich, Lukas and Waltl, Michael and Grasser, Tibor},
    title = {{A}b initio investigations in amorphous silicon dioxide: {P}roposing a multi-state defect model for electron and hole capture},
    journal = {{M}icroelectronics {R}eliability},
    year = {2022},
    volume = {139},
    number = {114801},
    url = {https://publik.tuwien.ac.at/files/publik_304552.pdf},
    doi = {10.1016/j.microrel.2022.114801},
    keywords = {{A}b initio studies in amorphous {S}i{O}2 {N}onradiative multi-phonon defect model {O}xygen vacancy {H}ydrogen bridge {H}ydroxyl-{E}{\&}{\#}8242; center {E}lectron/hole traps {M}etastability of defects {S}tatistics of defect properties {M}{O}{S}{F}{E}{T} {S}i/{S}i{C} substrates {B}ias temperature insta}

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