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@inproceedings{TUW-304603,
    author = {Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried},
    title = {{M}icrostructural {I}mpact on {E}lectromigration {R}eliability of {G}old {I}nterconnects},
    booktitle = {{S}{I}{S}{P}{A}{D} 2022: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices - {C}onference {A}bstract {B}ooklet},
    year = {2022},
    pages = {178--179},
    note = {talk: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D} 2022), {G}ranada, {S}pain; 2022-09-06 -- 2022-09-08}
}