@inproceedings{TUW-211819,
author = {Yoo, Han Woong and Verhaegen, Michel and von Royen, Martin E. and Schitter, Georg},
title = {Automated Adjustment of Aberration Correction in Scanning Confocal Microscopy},
booktitle = {Proceedings on IEEE Instrumentation and Measurement Technology Conference (I2MTC)},
year = {2012},
numpages = {6},
note = {Vortrag: IEEE International Instrumentation and Measurement Technology Conference (2012 I2MTC), Graz; 2012-05-13 -- 2012-05-16}
}
Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.