@inproceedings{TUW-211820,
author = {Kuiper, Stefan and Van den Hof, Paul M. J. and Schitter, Georg},
title = {Trade-off between the control bandwidth and the measurement accuracy in Atomic Force Microscopy},
booktitle = {Proceedings on IEEE Instrumentation and Measurement Technology Conference (I2MTC)},
year = {2012},
pages = {888--893},
note = {Vortrag: IEEE International Instrumentation and Measurement Technology Conference (2012 I2MTC), Graz; 2012-05-13 -- 2012-05-16}
}
Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.