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@inproceedings{TUW-211820,
    author = {Kuiper, Stefan and Van den Hof, Paul M. J. and Schitter, Georg},
    title = {Trade-off between the control bandwidth and the measurement accuracy in Atomic Force Microscopy},
    booktitle = {Proceedings on IEEE Instrumentation and Measurement Technology Conference (I2MTC)},
    year = {2012},
    pages = {888--893},
    note = {talk: IEEE International Instrumentation and Measurement Technology Conference (2012 I2MTC), Graz; 2012-05-13 -- 2012-05-16}
}