[Zurück]

@inproceedings{TUW-233517,
    author = {Biffl, Stefan and L{\"u}der, Arndt and Schmidt, Nicole and Winkler, Dietmar},
    title = {Early and Efficient Quality Assurance of Risky Technical Parameters in a Mechatronic Design Process},
    booktitle = {Proceedings of the 40th Annual Conference of the IEEE Industrial Electronics Society (IECON 2014)},
    year = {2014},
    publisher = {IEEE},
    keywords = {Risk Management for Manufacturing Systems Engineering, Mechatronic Engineering Process, Quality Assurance},
    note = {Vortrag: 40th Annual Conference of the IEEE Industrial Electronics Society (IECON 2014), Dallas, Texas; 2014-10-28 -- 2014-11-01}
}



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