[Zurück]

@unpublished{TUW-261701,
    author = {Kohl, Dominik and Mesquida, Patrick and Schitter, Georg},
    title = {Multi-frequency Kelvin Probe Force Microscopy Method for Charge Mapping Without DC-Bias},
    year = {2017},
    note = {Posterpr{\"a}sentation: Nano and Photonics {\&} FemtoMat, Mauterndorf; 2017-03-20 -- 2017-03-25}
}



Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.