[Zurück]

@article{TUW-288567,
    author = {Ito, Shingo and Poik, Matthias and Schlarp, Johannes and Schitter, Georg},
    title = {Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff},
    journal = {IEEE Transactions on Industrial Electronics},
    year = {2020},
    numpages = {9},
    url = {https://publik.tuwien.ac.at/files/publik_288567.pdf},
    doi = {10.1109/TIE.2020.2982113},
    keywords = {Atomic force microscopy , Mechatronics , Nanopositioning , Precision engineering , Design for control}
}