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@inproceedings{TUW-299517,
    author = {Hackl, Thomas and Poik, Matthias and Schitter, Georg},
    title = {Automated Probe-Sample Alignment for the Evaluation of Integrated Circuits},
    booktitle = {Proceedings of the Advanced Intelligent Mechatronics Conference 2020},
    year = {2021},
    note = {poster presentation: 2021 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), Delft, Netherlands; 2021-07-12 -- 2021-07-16}
}