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Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

G. Hanreich, L. Musiejovsky, J. Nicolics:
"Application of the Exodus Method for Thermal Characterization of Electronic Components";
Vortrag: International Spring Seminar on Electronics Technology (ISSE), Neusiedl am See, Austria; 04.05.1998 - 07.05.1998; in: "Proc. of 21st International Spring Seminar on Electronics Technology (ISSE 98)", Werkstoffe der Elektrotechnik, Wien (1998), ISBN: 3-85465-004-3; S. 172 - 176.



Kurzfassung englisch:
High effort is required for the measuring procedure to determine thermal characteristics of semiconductor components. However, the effect of even small design changes is not trivial to predict. The number of measurements can be reduced significantly using thermal simulation methods. In this work a modification to the Monte Carlo method, the Exodus method, has been adapted to solve three dimensional steady-state heat conduction problems with internal heat sources and combined convective and radiative boundary conditions. As a new approach this method is applied for thermal characterization of active electronic components. For this purpose the temperature at distinct points inside of the component in dependence on the internal loss power distribution has to be calculated. Uniquely the Monte Carlo method allows single point temperature calculations without the need of establishing the whole temperature field. In contrast to former works in our case the heat transfer coefficient is temperature dependent. The accuracy of the developed method is compared with the results of a program using a finite element method. The dependence of the accuracy and the running time on program parameters is discussed.

Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.