Talks and Poster Presentations (with Proceedings-Entry):
G. Schrom, De Vivek, S. Selberherr:
"VLSI Performance Metric Based on Minimum TCAD Simulations";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Cambridge, MA, USA;
1997-09-08
- 1997-09-10; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",
(1997),
ISBN: 0-7803-3775-1;
25
- 28.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/SISPAD.1997.621327
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_1998/CP1997_Schrom_1.pdf
Created from the Publication Database of the Vienna University of Technology.