Talks and Poster Presentations (with Proceedings-Entry):
M. Rottinger, N. Seifert, S. Selberherr:
"Simulation of AVC Measurements";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Leuven, Belgium;
1998-09-02
- 1998-09-04; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",
(1998),
ISBN: 3-211-83208-4;
284
- 287.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-7091-6827-1_72
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_1999/CP1998_Rottinger_1.pdf
Created from the Publication Database of the Vienna University of Technology.