Publications in Scientific Journals:
H. Ceric, S. Selberherr:
"Simulative Prediction of the Resistance Change due to Electromigration Induced Void Evolution";
Microelectronics Reliability,
42
(2002),
9-11;
1457
- 1460.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/S0026-2714(02)00169-5
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2003/CP2002_Ceric_3.pdf
Created from the Publication Database of the Vienna University of Technology.