Talks and Poster Presentations (with Proceedings-Entry):
V. Gopinath, S. Aronowitz, V. Palankovski, S. Selberherr:
"Effects of Stress-Induced Bandgap Narrowing on Reverse-Biased Junction Behavior";
Poster: European Solid-State Device Research Conference (ESSDERC),
Florence;
2002-09-24
- 2002-09-26; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)",
(2002),
ISBN: 88-900847-8-2;
631
- 634.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ESSDERC.2002.195010
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2003/CP2002_Palankovski_1.pdf
Created from the Publication Database of the Vienna University of Technology.