Publications in Scientific Journals:
G. Hobler, S. Selberherr:
"Two-Dimensional Modeling of Ion Implantation Induced Point Defects";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
7
(1988),
2;
174
- 180.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/43.3147
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_1989/JB1988_Hobler_1.pdf
Created from the Publication Database of the Vienna University of Technology.