Talks and Poster Presentations (with Proceedings-Entry):
R. Deutschmann, C. Fischer, C. Sala, S. Selberherr:
"Evaluation of Effective Device Parameters by Comparison of Measured and Simulated C-V Characteristics for Conventional and Pseudomorphic HEMTs";
Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP),
Wien;
1993-09-07
- 1993-09-09; in: "Proceedings SISDEP 93 Conference",
(1993),
ISBN: 3-211-82504-5;
461
- 464.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-7091-6657-4_114
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_1994/CP1993_Deutschmann_1.pdf
Created from the Publication Database of the Vienna University of Technology.