Publications in Scientific Journals:
P. Habas:
"The Application of Charge-Pumping Technique to Characterize the Si/Si02 Interface in Power VDMOSFETs";
Microelectronic Engineering,
28
(1995),
1-4;
171
- 174.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/0167-9317(95)00038-A
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/JB1995_Habas_1.pdf
Created from the Publication Database of the Vienna University of Technology.