Talks and Poster Presentations (with Proceedings-Entry):
W. Bohmayr, A. Burenkov, J. Lorenz, H. Ryssel, S. Selberherr:
"Statistical Accuracy and CPU Time Characteristic of Three Trajectory Split Methods for Monte Carlo Simulation of Ion Implantation";
Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP),
Erlangen;
1995-09-06
- 1995-09-08; in: "Proceedings SISDEP 95 Conference",
(1995),
ISBN: 3-211-82736-6;
492
- 495.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-7091-6619-2_119
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_1996/CP1995_Bohmayr_3.pdf
Created from the Publication Database of the Vienna University of Technology.