Publications in Scientific Journals:
A. Gehring, F. Jimenez-Molinos, H. Kosina, A. Palma, F. Gamiz, S. Selberherr:
"Modeling of Retention Time Degradation Due to Inelastic Trap-Assisted Tunneling in EEPROM Devices";
Microelectronics Reliability,
43
(2003),
9-11;
1495
- 1500.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/S0026-2714(03)00265-8
Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC04403711
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2004/JB2003_Gehring_2.pdf
Created from the Publication Database of the Vienna University of Technology.